Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners Conference

Tutt, Marcel N, Pavlidis, Dimitris, Tsironis, Christos. (1991). Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners . 19 66-75. 10.1109/arftg.1991.324021

cited authors

  • Tutt, Marcel N; Pavlidis, Dimitris; Tsironis, Christos

authors

publication date

  • June 1, 1991

keywords

  • 40 Engineering
  • 46 Information and Computing Sciences
  • 4601 Applied Computing

Digital Object Identifier (DOI)

Conference

  • 37th ARFTG Conference Digest

publisher

  • Institute of Electrical and Electronics Engineers (IEEE)

start page

  • 66

end page

  • 75

volume

  • 19