Tutt, Marcel N, Pavlidis, Dimitris, Tsironis, Christos. (1991). Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners
.
19 66-75. 10.1109/arftg.1991.324021
Tutt, Marcel N, Pavlidis, Dimitris, Tsironis, Christos. (1991). Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners
. 19 66-75. 10.1109/arftg.1991.324021