Rf Circuit Performance Degradation Due to Soft Breakdown and Hot-Carrier Effect in Deep-Submicrometer Cmos Technology Article

Li, Qiang, Zhang, Jinlong, Li, Wei et al. (2001). Rf Circuit Performance Degradation Due to Soft Breakdown and Hot-Carrier Effect in Deep-Submicrometer Cmos Technology . IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 49(9), 1546-1551. 10.1109/22.942565

cited authors

  • Li, Qiang; Zhang, Jinlong; Li, Wei; Yuan, Jiann S; Chen, Yuan; Oates, Anthony S

authors

publication date

  • January 1, 2001

published in

keywords

  • 51 Physical Sciences
  • 5103 Classical Physics

Digital Object Identifier (DOI)

publisher

  • Institute of Electrical and Electronics Engineers (IEEE)

start page

  • 1546

end page

  • 1551

volume

  • 49

issue

  • 9