Knowledge Transfer: Does More Experience Yield Improved Design Quality? Conference

Tolbert, DeLean, Lehman, Reis, Liu, Guannan et al. (2016). Knowledge Transfer: Does More Experience Yield Improved Design Quality? .

cited authors

  • Tolbert, DeLean; Lehman, Reis; Liu, Guannan; Sadler, Benjamin; Cardella, Monica

authors

date/time interval

  • October 12, 2016 -

publication date

  • January 1, 2016

keywords

  • Design
  • Education & Educational Research
  • Education, Scientific Disciplines
  • Engineering
  • Engineering, Electrical & Electronic
  • First-Year Engineering
  • Mathematics
  • Science & Technology
  • Social Sciences
  • Technology

Location

  • PA, Gannon Univ, Erie

Conference

  • IEEE Frontiers in Education Conference (FIE)

publisher

  • IEEE