Analysis and modeling of dispersion characteristics in AlGaN/GaN MODFETs Conference

Hsu, SSH, Pavlidis, D. (2003). Analysis and modeling of dispersion characteristics in AlGaN/GaN MODFETs . 119-122. 10.1109/gaas.2003.1252377

cited authors

  • Hsu, SSH; Pavlidis, D

abstract

  • The dispersion effects of transconductance (gm) and output resistance (Rds) in AlGaN/GaN MODFETs were investigated. The dispersion effects of gm were found to be much smaller than those of Rds. Devices under different biases show gm dispersion of ∼ 4% to 7%, while Rds dispersion of ∼ 19% to 44% in a frequency range of 50 Hz to 100 kHz. The trapping-detrapping time constants of the dispersion effects were extracted by employing a novel distributed RC network and carrier injection current sources. The time constants estimated are in a range of ∼ 1.5 μs to 1 ms.

publication date

  • January 1, 2003

Digital Object Identifier (DOI)

start page

  • 119

end page

  • 122