Low noise ALGaN/GaN MODFETs with high breakdown and power characteristics Conference

Hsu, SSH, Pavlidis, D, Moon, JS et al. (2001). Low noise ALGaN/GaN MODFETs with high breakdown and power characteristics . 229-232.

cited authors

  • Hsu, SSH; Pavlidis, D; Moon, JS; Micovic, M; Nguyen, C; Grider, D

abstract

  • Evaluation of AlGaN/GaN MODFET with low noise, high breakdown and power characteristics was done. A noise figure of 1.9 dB with associated gain of 16.2 dB was obtained at a quiescent point of VDS = 10 and IDS = 30 mA at 10 GHz. Investigation of a MODFET noise model and its correlation with gate leakage current was also done.

publication date

  • January 1, 2001

start page

  • 229

end page

  • 232