W-band on-wafer load-pull measurement system and its application to HEMT characterization Conference

Alekseev, E, Pavlidis, D, Tsironis, C. (1998). W-band on-wafer load-pull measurement system and its application to HEMT characterization . 3 1479-1482.

cited authors

  • Alekseev, E; Pavlidis, D; Tsironis, C

authors

abstract

  • An on-wafer large-signal characterization system has been developed for W-band frequency applications. The system is computer-controlled and employs a high-precision electromechanical W-band tuner. Its application to obtaining constant output power and gain contours as well as power saturation characteristics of submicron InP-based HEMTs is demonstrated at 77 GHz and 102 GHz.

publication date

  • January 1, 1998

start page

  • 1479

end page

  • 1482

volume

  • 3