Application of photoreflectance spectroscopy to the study of interface roughness in InGaAs/InAlAs heterointerfaces
Article
Bru-Chevallier, C, Baltagi, Y, Guillot, G et al. (1998). Application of photoreflectance spectroscopy to the study of interface roughness in InGaAs/InAlAs heterointerfaces
. JOURNAL OF APPLIED PHYSICS, 84(9), 5291-5295. 10.1063/1.368816
Bru-Chevallier, C, Baltagi, Y, Guillot, G et al. (1998). Application of photoreflectance spectroscopy to the study of interface roughness in InGaAs/InAlAs heterointerfaces
. JOURNAL OF APPLIED PHYSICS, 84(9), 5291-5295. 10.1063/1.368816