InP based monolithic integrated HEMT amplifiers and their material sensitivity Conference

Weiss, M, Ing Ng, G, Pavlidis, D. (1990). InP based monolithic integrated HEMT amplifiers and their material sensitivity . 2(20), 959-964. 10.1109/euma.1990.336189

cited authors

  • Weiss, M; Ing Ng, G; Pavlidis, D

abstract

  • Experimental results on InP based In0.53+xGa0.47-xAs/In0.52Al0.48As HEMT monolithic integrated amplifiers are reported demonstrating the feasibility of this technology. Strained heteroepitaxy (x≥0.0) proved to enhance the device performance and upper frequency limits and was used for the MMIC-realization. More than 15 dB of gain were obtained from 6 to 9.5 GHz. The maximum gain was 22 dB and the return loss better than -10 dB. In spite of the strained heteroepitaxy which can raise material control questions for MMIC realizations the experimental results for the samples (x = 0.07 and x = 0.22) showed good agreement with design objectives.

publication date

  • January 1, 1990

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 10

International Standard Book Number (ISBN) 13

start page

  • 959

end page

  • 964

volume

  • 2

issue

  • 20