Synthetic Aperture Gaussian Beam Measurement System for Wideband Characterization of RF Materials and Metamaterials Conference

Chung, Jae-Young, Sertel, Kubilay, Volakis, John L. (2008). Synthetic Aperture Gaussian Beam Measurement System for Wideband Characterization of RF Materials and Metamaterials . 2020 IEEE INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION AND NORTH AMERICAN RADIO SCIENCE MEETING, 3523-3526.

keywords

  • CRYSTALS
  • Engineering
  • Engineering, Electrical & Electronic
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology
  • Telecommunications

International Standard Book Number (ISBN) 13

start page

  • 3523

end page

  • 3526