Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates Conference

Lee, KJ, Bhattacharya, S, Varadarajan, M et al. (2005). Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates . 2005 249-254. 10.1109/ISAPM.2005.1432084

cited authors

  • Lee, KJ; Bhattacharya, S; Varadarajan, M; Wan, L; Abothu, IR; Sundaram, V; Muthana, P; Balaraman, D; Raj, PM; Swaminathan, M; Sitaraman, S; Tummala, R; Viswanadham, P; Dunford, S; Lauffer, J

authors

abstract

  • Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based Polymer Thick Film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JEDEC standards are presented. © 2005 IEEE.

publication date

  • December 1, 2005

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 10

International Standard Book Number (ISBN) 13

start page

  • 249

end page

  • 254

volume

  • 2005