Edge sharpening for unbiased edge detection in field emission scanning electron microscope images Article

Raj, PM, Dunn, SM, Cannon, WR. Edge sharpening for unbiased edge detection in field emission scanning electron microscope images . Microscopy and Microanalysis, 5(2), 136-146. 10.1017/S1431927699000100

cited authors

  • Raj, PM; Dunn, SM; Cannon, WR

authors

published in

keywords

  • MICROGRAPHS
  • Materials Science
  • Materials Science, Multidisciplinary
  • Microscopy
  • ORIENTATION ANALYSIS
  • Science & Technology
  • Technology
  • edge detection
  • edge gradients
  • field emission scanning electron microscope
  • image analysis
  • orientation
  • sharpening
  • tape casting

Digital Object Identifier (DOI)

start page

  • 136

end page

  • 146

volume

  • 5

issue

  • 2