XPS depth profiling and leakage properties of anodized titania dielectrics and their application in high-density capacitors Article

Chakraborti, Parthasarathi, Sharma, Himani, Pulugurtha, Markondeya Raj et al. (2015). XPS depth profiling and leakage properties of anodized titania dielectrics and their application in high-density capacitors . JOURNAL OF MATERIALS SCIENCE, 50(23), 7600-7609. 10.1007/s10853-015-9320-6

cited authors

  • Chakraborti, Parthasarathi; Sharma, Himani; Pulugurtha, Markondeya Raj; Tummala, Rao

authors

publication date

  • December 1, 2015

published in

keywords

  • FILMS
  • IONIC-CONDUCTIVITY
  • Materials Science
  • Materials Science, Multidisciplinary
  • SURFACE
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • SPRINGER

start page

  • 7600

end page

  • 7609

volume

  • 50

issue

  • 23