Formation of uniform aminosilane thin layers: An imine formation to measure relative surface density of the amine group Letter

Moon, JH, Shin, JW, Kim, SY et al. (1996). Formation of uniform aminosilane thin layers: An imine formation to measure relative surface density of the amine group . LANGMUIR, 12(20), 4621-4624. 10.1021/la9604339

cited authors

  • Moon, JH; Shin, JW; Kim, SY; Park, JW

authors

publication date

  • October 2, 1996

published in

keywords

  • BUILDUP
  • CATIONIC BIPOLAR AMPHIPHILES
  • CHARGED SURFACES
  • CONSECUTIVE ADSORPTION
  • COUPLING AGENTS
  • Chemistry
  • Chemistry, Multidisciplinary
  • Chemistry, Physical
  • FORCE MICROSCOPY
  • Materials Science
  • Materials Science, Multidisciplinary
  • NONLINEAR-OPTICAL-MATERIALS
  • Physical Sciences
  • RAY PHOTOELECTRON-SPECTROSCOPY
  • SELF-ASSEMBLED MONOLAYERS
  • Science & Technology
  • Technology
  • ULTRATHIN MULTILAYER FILMS

Digital Object Identifier (DOI)

publisher

  • AMER CHEMICAL SOC

start page

  • 4621

end page

  • 4624

volume

  • 12

issue

  • 20