Absolute surface density of the amine group of the aminosilylated thin layers: Ultraviolet-visible spectroscopy, second harmonic generation, and synchrotron-radiation photoelectron spectroscopy study Article

Moon, JH, Kim, JH, Kim, K et al. (1997). Absolute surface density of the amine group of the aminosilylated thin layers: Ultraviolet-visible spectroscopy, second harmonic generation, and synchrotron-radiation photoelectron spectroscopy study . LANGMUIR, 13(16), 4305-4310. 10.1021/la9705118

cited authors

  • Moon, JH; Kim, JH; Kim, K; Kang, TH; Kim, B; Kim, CH; Hahn, JH; Park, JW

authors

publication date

  • August 6, 1997

webpage

published in

keywords

  • CATALYSIS
  • COUPLING AGENTS
  • Chemistry
  • Chemistry, Multidisciplinary
  • Chemistry, Physical
  • ETHOXYSILANES
  • FILM
  • Materials Science
  • Materials Science, Multidisciplinary
  • Physical Sciences
  • QUANTIFICATION
  • RAMAN-SPECTROSCOPY
  • SELF-ASSEMBLED MONOLAYERS
  • SILICA SURFACES
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • AMER CHEMICAL SOC

start page

  • 4305

end page

  • 4310

volume

  • 13

issue

  • 16