A measurement process to characterize natural and engineered low-loss uniaxial dielectric materials at microwave frequencies Article

Mumcu, Gokhan, Sertel, Kubilay, Volakis, John L. (2008). A measurement process to characterize natural and engineered low-loss uniaxial dielectric materials at microwave frequencies . IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 56(1), 217-223. 10.1109/TMTT.2007.912168

keywords

  • ANISOTROPIC COMPLEX PERMITTIVITY
  • ANTENNA
  • CRYSTALS
  • Engineering
  • Engineering, Electrical & Electronic
  • MODES
  • Science & Technology
  • THICKNESS
  • Technology
  • anisotropy
  • engineered materials
  • low-loss dielectric materials
  • microwave measurements
  • uniaxial dielectric characterization

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 217

end page

  • 223

volume

  • 56

issue

  • 1