Development of superconducting electrode capacitor using a YBa2Cu3O7_x thick film and Y2BaCuO5 dielectric Article

Jones, WK, Olmedo, RA, Hu, ZQ et al. (1991). Development of superconducting electrode capacitor using a YBa2Cu3O7_x thick film and Y2BaCuO5 dielectric . IEEE TRANSACTIONS ON MAGNETICS, 27(2), 1619-1621. 10.1109/20.133495

cited authors

  • Jones, WK; Olmedo, RA; Hu, ZQ; Larkins, G

authors

abstract

  • Different phases in the YO1.5-BaO-CuO phase diagram were evaluated for dielectric properties and compatibility with subsequent firing of a YBa2Cu3O7_x thick film. Y2BaCuOs (211) was chosen for capacitor manufacture because it showed no reaction with the YBazCu3O7_x (123) thick film upon sintering. AC field exclusion confirmed the superconductivity of the 123 thick film on the 211 substrate with Tc at 93°K. Scanning electron microscopy of the interface between the 211 substrate and the 123 thick film showed neither a reaction or the formation of a third phase. capacitor samples were manufactured in various sizes. All sizes were found to have the following characteristics: for a range from 0.1-110 MHz, at 77°K, the phase angle of the impedance remains constant at -90°. The same is true at 298°K. This would be an improvement over a commercial chip capacitor for which the curve is constant only for a small range. The dielectric constant remains at 24 over the 0.1-110 MHz frequency range at 77 and 298°K. In addition, the capacitance of the sample was found to be constant over frequency. We conclude that 211 substrates are suitable for the formation of a low-loss capacitor with superconducting electrodes. © 1991 IEEE

publication date

  • January 1, 1991

published in

Digital Object Identifier (DOI)

start page

  • 1619

end page

  • 1621

volume

  • 27

issue

  • 2