Scanning Anode Field Emission and Variable Temperature High-Frequency Microprobe System for Vacuum Integrated Nanoelectronics Grant

Scanning Anode Field Emission and Variable Temperature High-Frequency Microprobe System for Vacuum Integrated Nanoelectronics .

date/time interval

  • March 15, 2019 - March 14, 2020

awarded by

subcontracted through

administered by

sponsor award ID

  • 4500003174

contributor