Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
2023 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION, NEMO
Journal
Overview
Identifiers
View All
Overview
publication venue for
Bi-Layered Magnetic Electromagnetic Interference Shields with Thinner Metals
2023
Identifiers
International Standard Serial Number (ISSN)
2575-4742