Vulnerable Children and Youth Studies

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Vulnerable Children and Youth Studies Journal

publication venue for

Maternal HIV/AIDS and adolescent depression: A covariance structure analysis of the 'Parents and Children Coping Together' (PACT) Model. 4:67-82. 2009

International Standard Serial Number (ISSN)

1745-0128

Electronic International Standard Serial Number (EISSN)

1745-0136