Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
JOURNAL OF RADIATION RESEARCH AND APPLIED SCIENCES
Journal
Overview
Identifiers
View All
Overview
publication venue for
A new non-parametric hypothesis testing with reliability analysis applications to model some real data
. 16.
2023
Identifiers
International Standard Serial Number (ISSN)
1687-8507