Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
Microelectronics Reliability
Journal
Overview
Identifiers
View All
Overview
publication venue for
Reliability characteristics of GaAs and InP-based heterojunction bipolar transistors
1999
Identifiers
International Standard Serial Number (ISSN)
0026-2714
