Forensic analysis of glass by mu-XRF, SN-ICP-MS, LA-ICP-MS and LA-ICP-OES: evaluation of the performance of different criteria for comparing elemental composition Article

Trejos, Tatiana, Koons, Robert, Weis, Peter et al. (2013). Forensic analysis of glass by mu-XRF, SN-ICP-MS, LA-ICP-MS and LA-ICP-OES: evaluation of the performance of different criteria for comparing elemental composition . JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 28(8), 1270-1282. 10.1039/c3ja50128k

International Collaboration

cited authors

  • Trejos, Tatiana; Koons, Robert; Weis, Peter; Becker, Stefan; Berman, Ted; Dalpe, Claude; Duecking, Marc; Buscaglia, JoAnn; Eckert-Lumsdon, Tiffany; Ernst, Troy; Hanlon, Christopher; Heydon, Alex; Mooney, Kim; Nelson, Randall; Olsson, Kristine; Schenk, Emily; Palenik, Christopher; Pollock, Edward Chip; Rudell, David; Ryland, Scott; Tarifa, Anamary; Valadez, Melissa; van Es, Andrew; Zdanowicz, Vincent; Almirall, Jose

sustainable development goals

authors

publication date

  • January 1, 2013

webpage

published in

keywords

  • ATOMIC-EMISSION-SPECTROMETRY
  • Chemistry
  • Chemistry, Analytical
  • DISCRIMINATION
  • FRAGMENTS
  • LASER-ABLATION
  • MATCH CRITERIA
  • PLASMA-MASS SPECTROMETRY
  • Physical Sciences
  • QUANTITATIVE-ANALYSIS
  • REFRACTIVE-INDEX
  • SAMPLING STRATEGIES
  • Science & Technology
  • Spectroscopy
  • Technology
  • X-RAY-FLUORESCENCE

Digital Object Identifier (DOI)

publisher

  • ROYAL SOC CHEMISTRY

start page

  • 1270

end page

  • 1282

volume

  • 28

issue

  • 8