Electro-Optical Characterization of nanoGUMBOS Article

Sarkar, A, Kanakamedala, K, Rajathadripura, MD et al. (2014). Electro-Optical Characterization of nanoGUMBOS . Electronic Materials Letters, 10(4), 775-781. 10.1007/s13391-013-3284-y

cited authors

  • Sarkar, A; Kanakamedala, K; Rajathadripura, MD; Jagadish, NN; Magut, PKS; de Rooy, S; Das, S; El-Zahab, B; Warner, IM; Daniels-Race, T

authors

publication date

  • July 1, 2014

webpage

published in

keywords

  • AFM
  • ATOMIC-FORCE MICROSCOPY
  • ELECTRONICS
  • Materials Science
  • Materials Science, Multidisciplinary
  • NANOTECHNOLOGY
  • RAMAN-SPECTROSCOPY
  • SCANNING PROBE MICROSCOPY
  • SURFACE
  • Science & Technology
  • TOOL
  • Technology
  • conductive probe atomic force microscopy (CP-AFM)
  • hybrid electronic materials (HEMs)
  • nanoGUMBOS
  • raman spectroscopy

Digital Object Identifier (DOI)

start page

  • 775

end page

  • 781

volume

  • 10

issue

  • 4