Estimation of the thickness of overlapping materials by using neural networks Conference

Reen, N, Tansel, IN, Chen, P et al. (2005). Estimation of the thickness of overlapping materials by using neural networks . 3RD INTERNATIONAL WORKSHOP ON NUCLEON STRUCTURE AT LARGE BJORKEN X, 760 671-677.

cited authors

  • Reen, N; Tansel, IN; Chen, P; Wang, X; Inanc, F; Kropas-Hughes, C

sustainable development goals

authors

date/time interval

  • July 25, 2004 -

publication date

  • January 1, 2005

webpage

published in

keywords

  • Acoustics
  • Engineering
  • Engineering, Electrical & Electronic
  • Materials Science
  • Materials Science, Characterization & Testing
  • Materials Science, Multidisciplinary
  • Optics
  • Physical Sciences
  • Science & Technology
  • Technology

Location

  • Colorado Sch Mines, Golden, CO

International Standard Book Number (ISBN) 10

Conference

  • 31st Annual Review of Progress in Quantitative Nondestructive Evaluation

publisher

  • AMER INST PHYSICS

start page

  • 671

end page

  • 677

volume

  • 760