Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In situ stress and strain measurements at high pressure and temperature Conference

Girard, Jennifer, Chen, Jiuhua, Raterron, Paul et al. (2010). Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In situ stress and strain measurements at high pressure and temperature . JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 71(8), 1053-1058. 10.1016/j.jpcs.2010.03.005

International Collaboration

cited authors

  • Girard, Jennifer; Chen, Jiuhua; Raterron, Paul; Holyoke, Caleb

sustainable development goals

authors

date/time interval

  • March 28, 2009 -

publication date

  • August 1, 2010

webpage

published in

keywords

  • Chemistry
  • Chemistry, Multidisciplinary
  • High pressure
  • Inorganic compounds
  • Mechanical properties
  • Physical Sciences
  • Physics
  • Physics, Condensed Matter
  • Science & Technology
  • X-ray diffraction

Location

  • Miami, FL

Digital Object Identifier (DOI)

Conference

  • 5th International Conference on Study of Matter at Extreme Conditions

publisher

  • PERGAMON-ELSEVIER SCIENCE LTD

start page

  • 1053

end page

  • 1058

volume

  • 71

issue

  • 8