Study on the High-Pressure Behavior of Goethite up to 32 GPa Using X-Ray Diffraction, Raman, and Electrical Impedance Spectroscopy Article

Tang, Ruilian, Chen, Jiuhua, Zeng, Qiaoshi et al. (2020). Study on the High-Pressure Behavior of Goethite up to 32 GPa Using X-Ray Diffraction, Raman, and Electrical Impedance Spectroscopy . 10(2), 10.3390/min10020099

Open Access International Collaboration

cited authors

  • Tang, Ruilian; Chen, Jiuhua; Zeng, Qiaoshi; Li, Yan; Liang, Xue; Yang, Bin; Wang, Yu

sustainable development goals

authors

publication date

  • February 1, 2020

webpage

keywords

  • EPSILON-FEOOH
  • EQUATION-OF-STATE
  • Geochemistry & Geophysics
  • HYDROGEN
  • IRON-OXIDES
  • Mineralogy
  • Mining & Mineral Processing
  • PHASE-TRANSITIONS
  • Physical Sciences
  • Raman spectroscopy
  • SYMMETRIZATION
  • Science & Technology
  • electrical impedance spectroscopy
  • electrical resistance
  • goethite
  • high-pressure
  • phase transition
  • x-ray di ffraction

Digital Object Identifier (DOI)

publisher

  • MDPI

volume

  • 10

issue

  • 2