Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method
Article
Alwan, Elias A, Kiourti, Asimina, Volakis, John L. (2015). Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method
. IEEE ACCESS, 3 648-652. 10.1109/ACCESS.2015.2433062
Alwan, Elias A, Kiourti, Asimina, Volakis, John L. (2015). Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method
. IEEE ACCESS, 3 648-652. 10.1109/ACCESS.2015.2433062