Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method Article

Alwan, Elias A, Kiourti, Asimina, Volakis, John L. (2015). Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method . IEEE ACCESS, 3 648-652. 10.1109/ACCESS.2015.2433062

Open Access

cited authors

  • Alwan, Elias A; Kiourti, Asimina; Volakis, John L

publication date

  • January 1, 2015

published in

keywords

  • Calibration
  • Computer Science
  • Computer Science, Information Systems
  • Engineering
  • Engineering, Electrical & Electronic
  • LINE
  • RADIO
  • Science & Technology
  • Technology
  • Telecommunications
  • indium tin oxide (ITO)
  • open ended coaxial probe
  • thin film characterization

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 648

end page

  • 652

volume

  • 3