A Novel PUF based on Cell Error Rate Distribution of STT-RAM Conference

Zhang, Xian, Sun, Guangyu, Zhang, Yaojun et al. (2016). A Novel PUF based on Cell Error Rate Distribution of STT-RAM . 342-347.

International Collaboration

cited authors

  • Zhang, Xian; Sun, Guangyu; Zhang, Yaojun; Chen, Yiran; Li, Hai; Wen, Wujie; Di, Jia

authors

date/time interval

  • January 25, 2016 -

publication date

  • January 1, 2016

webpage

keywords

  • Automation & Control Systems
  • DEVICE AUTHENTICATION
  • Engineering
  • Engineering, Electrical & Electronic
  • MEMORY
  • Science & Technology
  • Technology

Location

  • Macao, PEOPLES R CHINA

Conference

  • 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

publisher

  • IEEE

start page

  • 342

end page

  • 347