Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts Article

Eller, MJ, Verkhoturov, SV, Fernandez-Lima, FA et al. (2013). Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts . Surface and Interface Analysis, 45(1), 529-531. 10.1002/sia.4949

International Collaboration

cited authors

  • Eller, MJ; Verkhoturov, SV; Fernandez-Lima, FA; DeBord, JD; Schweikert, EA; Della-Negra, S

sustainable development goals

authors

publication date

  • January 1, 2013

webpage

published in

keywords

  • Chemistry
  • Chemistry, Physical
  • Cluster SIMS
  • EMISSION
  • Electron Emission
  • Electron Emission Microscope
  • Localization
  • MASS-SPECTROMETRY
  • Physical Sciences
  • SURFACE
  • Science & Technology

Digital Object Identifier (DOI)

start page

  • 529

end page

  • 531

volume

  • 45

issue

  • 1