Annealing effects on the microstructure and magnetic properties of Y3Fe5O12 films deposited on Si/SiO2 substrates by RF magnetron sputtering Article

Lian, Jianyun, Chen, Ying, Liu, Zhen et al. (2017). Annealing effects on the microstructure and magnetic properties of Y3Fe5O12 films deposited on Si/SiO2 substrates by RF magnetron sputtering . CERAMICS INTERNATIONAL, 43(10), 7477-7481. 10.1016/j.ceramint.2017.03.023

cited authors

  • Lian, Jianyun; Chen, Ying; Liu, Zhen; Zhu, Mingkang; Wang, Genshui; Zhang, Wenbin; Dong, Xianlin

authors

publication date

  • July 1, 2017

published in

keywords

  • Annealing Ferromagnetic resonance linewidth
  • COOLING RATE
  • Crack-free
  • GROWTH
  • IRON-GARNET FILMS
  • Materials Science
  • Materials Science, Ceramics
  • Science & Technology
  • TEMPERATURE
  • Technology
  • YIG THIN-FILMS
  • YIG film
  • YTTRIUM

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCI LTD

start page

  • 7477

end page

  • 7481

volume

  • 43

issue

  • 10