Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy Article

Krogmeier, JR, Dunn, RC. (2001). Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy . APPLIED PHYSICS LETTERS, 79(27), 4494-4496. 10.1063/1.1430028

Open Access

cited authors

  • Krogmeier, JR; Dunn, RC

sustainable development goals

authors

publication date

  • December 31, 2001

published in

keywords

  • PROBES
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology

Digital Object Identifier (DOI)

publisher

  • AMER INST PHYSICS

start page

  • 4494

end page

  • 4496

volume

  • 79

issue

  • 27