The Study On LED Accelerated Life Testes And Failure Mechanism Conference

Zhang, Yuezong, Li, Chunxiai, Zhang, Wenbin. (2014). The Study On LED Accelerated Life Testes And Failure Mechanism . Applied Mechanics and Materials, 462-463 678-+. 10.4028/www.scientific.net/AMM.462-463.678

cited authors

  • Zhang, Yuezong; Li, Chunxiai; Zhang, Wenbin

authors

date/time interval

  • October 19, 2013 -

publication date

  • January 1, 2014

published in

keywords

  • Computer Science
  • Computer Science, Artificial Intelligence
  • Engineering
  • Engineering, Mechanical
  • LIGHT-EMITTING-DIODES
  • Materials Science
  • Materials Science, Multidisciplinary
  • Mechanics
  • Science & Technology
  • Technology
  • accelerated life test
  • degeneration
  • failure mechanism

Location

  • PEOPLES R CHINA, Guilin

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 13

Conference

  • International Conference on Mechatronics and Information Technology (ICMIT 2013)

publisher

  • TRANS TECH PUBLICATIONS LTD

start page

  • 678

end page

  • +

volume

  • 462-463