Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4 Conference

Ching, WY, Chen, Jun, Rulis, Paul et al. (2006). Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4 . JOURNAL OF MATERIALS SCIENCE, 41(16), 5061-5067. 10.1007/s10853-006-0446-4

International Collaboration

cited authors

  • Ching, WY; Chen, Jun; Rulis, Paul; Ouyang, Lizhi; Misra, Anil

authors

date/time interval

  • June 26, 2005 -

publication date

  • August 1, 2006

published in

keywords

  • ATOMIC STRUCTURES
  • BEHAVIOR
  • MOLECULAR-DYNAMICS
  • Materials Science
  • Materials Science, Multidisciplinary
  • PHASE
  • SEGREGATION
  • SIMULATION
  • Science & Technology
  • THICKNESS
  • TRANSMISSION ELECTRON-MICROSCOPY
  • Technology
  • YTTRIUM

Location

  • SPAIN, Univ Santiago, Santiago Compostela

Digital Object Identifier (DOI)

Conference

  • 6th International Workshop on Interfaces

publisher

  • SPRINGER

start page

  • 5061

end page

  • 5067

volume

  • 41

issue

  • 16