Ab initio calculations of strain fields and failure patterns in silicon nitride intergranular glassy films Article

Misra, A, Ouyang, L, Chen, J et al. (2007). Ab initio calculations of strain fields and failure patterns in silicon nitride intergranular glassy films . PHILOSOPHICAL MAGAZINE, 87(25), 3839-3852. 10.1080/14786430701422206

cited authors

  • Misra, A; Ouyang, L; Chen, J; Ching, WY

authors

publication date

  • January 1, 2007

published in

keywords

  • ALUMINA
  • EQUILIBRIUM THICKNESS
  • GRAIN-BOUNDARY FILMS
  • Materials Science
  • Materials Science, Multidisciplinary
  • Metallurgy & Metallurgical Engineering
  • POLYCRYSTALLINE CERAMICS
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • TOTAL-ENERGY CALCULATIONS
  • Technology
  • WAVE BASIS-SET

Digital Object Identifier (DOI)

publisher

  • TAYLOR & FRANCIS LTD

start page

  • 3839

end page

  • 3852

volume

  • 87

issue

  • 25