Surface roughness and growth texture of (Ba,Sr)TiO3 thin films formed by MOCVD Conference

Gao, Y, Alluri, P, He, S et al. (1999). Surface roughness and growth texture of (Ba,Sr)TiO3 thin films formed by MOCVD . 541 29-34.

cited authors

  • Gao, Y; Alluri, P; He, S; Engelhard, M; Lea, AS; Finder, J; Melnick, B; Hance, RL

sustainable development goals

authors

date/time interval

  • November 30, 1998 -

publication date

  • January 1, 1999

keywords

  • (BA
  • CHEMICAL-VAPOR-DEPOSITION
  • ELECTRICAL-PROPERTIES
  • Materials Science
  • Materials Science, Characterization & Testing
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Science & Technology
  • Technology

Location

  • MA, BOSTON

International Standard Book Number (ISBN) 10

Conference

  • Symposium on Ferroelectric Thin Films VII

publisher

  • MATERIALS RESEARCH SOCIETY

start page

  • 29

end page

  • 34

volume

  • 541