Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy Conference

Ramdani, J, Droopad, R, Yu, Z et al. (2000). Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy . APPLIED SURFACE SCIENCE, 159 127-133. 10.1016/S0169-4332(00)00050-7

cited authors

  • Ramdani, J; Droopad, R; Yu, Z; Curless, JA; Overgaard, CD; Finder, J; Eisenbeiser, K; Hallmark, JA; Ooms, WJ; Kaushik, V; Alluri, P; Pietambaram, S

sustainable development goals

authors

date/time interval

  • October 25, 1999 -

publication date

  • June 1, 2000

published in

keywords

  • Chemistry
  • Chemistry, Physical
  • MBE
  • Materials Science
  • Materials Science, Coatings & Films
  • OXIDES
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • SILICON
  • Science & Technology
  • SrTiO3
  • Technology
  • epitaxy
  • interface
  • silicon

Location

  • JAPAN, KARUIZAWA

Digital Object Identifier (DOI)

Conference

  • 3rd International Symposium on the Control of Semiconductor Interfaces (ISCSI-3)

publisher

  • ELSEVIER SCIENCE BV

start page

  • 127

end page

  • 133

volume

  • 159