Machine Learning Aided Nondestructive IC Testing by THz Response Conference

Hasan, Muhammad Mahmudul, Pala, Nezih, Shur, Michael. (2023). Machine Learning Aided Nondestructive IC Testing by THz Response . 2021 ANNUAL CONFERENCE OF THE IEEE PHOTONICS SOCIETY (IPC), 10.1109/IPC57732.2023.10360698

cited authors

  • Hasan, Muhammad Mahmudul; Pala, Nezih; Shur, Michael

sustainable development goals

authors

date/time interval

  • November 12, 2023 -

publication date

  • January 1, 2023

published in

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Optics
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology
  • artificial intelligence
  • decision tree
  • hardware security
  • machine learning
  • nondestructive testing
  • terahertz system

Location

  • FL, Orlando

Digital Object Identifier (DOI)

Conference

  • Annual Conference of the IEEE-Photonics-Society (IPC)

publisher

  • IEEE