Anomaly Detection in Embedded Devices Through Hardware Introspection Conference

Reyes, David Llanio, Perez-Pons, Alexander, Dean, Rogelio Bofill. (2023). Anomaly Detection in Embedded Devices Through Hardware Introspection . 10.1109/SVCC56964.2023.10165049

cited authors

  • Reyes, David Llanio; Perez-Pons, Alexander; Dean, Rogelio Bofill

authors

date/time interval

  • May 17, 2023 -

publication date

  • January 1, 2023

keywords

  • Computer Science
  • Computer Science, Artificial Intelligence
  • Computer Science, Software Engineering
  • HIAD
  • JTAG
  • Science & Technology
  • Technology
  • anomaly
  • cyber-attacks
  • embedded devices
  • machine learning
  • security

Location

  • CA, San Jose

Digital Object Identifier (DOI)

Conference

  • IEEE Silicon Valley Cybersecurity Conference (SVCC)

publisher

  • IEEE