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A Noninvasive Technique to Detect Authentic/Counterfeit SRAM Chips
Article
Talukder, BMS Bahar, Ferdaus, Farah, Rahman, Md T. (2023). A Noninvasive Technique to Detect Authentic/Counterfeit SRAM Chips .
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS,
19(2), 10.1145/3597024
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Talukder, BMS Bahar, Ferdaus, Farah, Rahman, Md T. (2023). A Noninvasive Technique to Detect Authentic/Counterfeit SRAM Chips .
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS,
19(2), 10.1145/3597024
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Overview
cited authors
Talukder, BMS Bahar; Ferdaus, Farah; Rahman, Md T
authors
Rahman, Tauhidur
publication date
April 1, 2023
published in
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS
Journal
Research
keywords
COUNTERFEIT INTEGRATED-CIRCUITS
Computer Science
Computer Science, Hardware & Architecture
Counterfeit memory
DESIGN
Engineering
Engineering, Electrical & Electronic
Nanoscience & Nanotechnology
RELIABILITY
Science & Technology
Science & Technology - Other Topics
Technology
VARIABILITY
VOLTAGE
anti-counterfeiting
counterfeit SRAM
semiconductor supply-chain security
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1145/3597024
Additional Document Info
publisher
ASSOC COMPUTING MACHINERY
volume
19
issue
2