2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Book

cited authors

Gan, Chee Lip

authors

Gan, Albert

publication date

January 1, 2008

keywords

Technology & Engineering

International Standard Book Number (ISBN) 10

1424420393

International Standard Book Number (ISBN) 13

9781424420391