PROBE HOLE FIELD ELECTRON FIELD-ION MICROSCOPY AND ENERGY SPECTROSCOPY OF ULTRASHARP [111]-ORIENTED TUNGSTEN TIPS Conference

UNGER, J, VLASOV, YA, ERNST, N. (1995). PROBE HOLE FIELD ELECTRON FIELD-ION MICROSCOPY AND ENERGY SPECTROSCOPY OF ULTRASHARP [111]-ORIENTED TUNGSTEN TIPS . APPLIED SURFACE SCIENCE, 87-8(1-4), 45-52. 10.1016/0169-4332(94)00490-0

International Collaboration

keywords

  • Chemistry
  • Chemistry, Physical
  • Materials Science
  • Materials Science, Coatings & Films
  • POINT SOURCES
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • SINGLE-ATOM TIPS
  • Science & Technology
  • Technology

Location

  • ROUEN, FRANCE

Digital Object Identifier (DOI)

Conference

  • 41st International Field Emission Symposium (IFES 94)

publisher

  • ELSEVIER SCIENCE BV

start page

  • 45

end page

  • 52

volume

  • 87-8

issue

  • 1-4