SCARe: An SRAM-Based Countermeasure Against IC Recycling Article

Guo, Zimu, Xu, Xiaolin, Rahman, Md Tauhidur et al. (2018). SCARe: An SRAM-Based Countermeasure Against IC Recycling . IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 26(4), 744-755. 10.1109/TVLSI.2017.2777262

Open Access

keywords

  • Computer Science
  • Computer Science, Hardware & Architecture
  • Counterfeit
  • DESIGN
  • Engineering
  • Engineering, Electrical & Electronic
  • Science & Technology
  • Technology
  • physical unclonable function (PUF)
  • recycling
  • security
  • static random-access memory-(SRAM),-system-on-chips-(SoCs)

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 744

end page

  • 755

volume

  • 26

issue

  • 4