Reliability Analysis of the New Exponential Inverted Topp-Leone Distribution with Applications Article

Metwally, Ahmed Sayed M, Hassan, Amal S, Almetwally, Ehab M et al. (2021). Reliability Analysis of the New Exponential Inverted Topp-Leone Distribution with Applications . 23(12), 10.3390/e23121662

Open Access International Collaboration

cited authors

  • Metwally, Ahmed Sayed M; Hassan, Amal S; Almetwally, Ehab M; Kibria, BM Golam; Almongy, Hisham M

authors

publication date

  • December 1, 2021

keywords

  • BAYESIAN-ANALYSIS
  • Bayesian
  • ENTROPY
  • LOMAX DISTRIBUTION
  • MODEL
  • PARAMETER-ESTIMATION
  • Physical Sciences
  • Physics
  • Physics, Multidisciplinary
  • Science & Technology
  • entropy
  • maximum product spacing
  • new exponential-X
  • stress-strength reliability

Digital Object Identifier (DOI)

publisher

  • MDPI

volume

  • 23

issue

  • 12