AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware Security and Reliability Article

Akter, Naznin, Siddiquee, Masudur R, Shur, Michael et al. (2021). AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware Security and Reliability . IEEE ACCESS, 9 64499-64509. 10.1109/ACCESS.2021.3075429

Open Access

cited authors

  • Akter, Naznin; Siddiquee, Masudur R; Shur, Michael; Pala, Nezih

sustainable development goals

authors

publication date

  • January 1, 2021

webpage

published in

keywords

  • Computer Science
  • Computer Science, Information Systems
  • Convolution
  • DEVICE
  • Engineering
  • Engineering, Electrical & Electronic
  • Frequency measurement
  • Hardware
  • INSPECTION
  • Imaging
  • Integrated circuits
  • Pins
  • RADIATION
  • Science & Technology
  • Technology
  • Telecommunications
  • Terahertz
  • Testing
  • artificial intelligence
  • authentication
  • convolution neural network
  • deep learning
  • hardware cybersecurity
  • reliability

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 64499

end page

  • 64509

volume

  • 9