A Review of: “Microstructural Characterization of Materials” by David Brandon and Wayne D. Kaplan Article

Agarwal, Arvind. (2000). A Review of: “Microstructural Characterization of Materials” by David Brandon and Wayne D. Kaplan . MATERIALS AND MANUFACTURING PROCESSES, 15(3), 470-472. 10.1080/10426910008928251

cited authors

  • Agarwal, Arvind

authors

publication date

  • May 1, 2000

published in

keywords

  • 40 Engineering
  • 4014 Manufacturing Engineering
  • 4016 Materials Engineering

Digital Object Identifier (DOI)

publisher

  • Taylor & Francis

start page

  • 470

end page

  • 472

volume

  • 15

issue

  • 3