Structural analyses of phase stability in amorphous and partially crystallized Ge-rich GeTe films prepared by atomic layer deposition Article

Gwon, T, Mohamed, AY, Yoo, C et al. (2017). Structural analyses of phase stability in amorphous and partially crystallized Ge-rich GeTe films prepared by atomic layer deposition . ACS APPLIED MATERIALS & INTERFACES, 9(47), 41387-41396.

cited authors

  • Gwon, T; Mohamed, AY; Yoo, C; Park, E; Kim, S; Yoo, S; Lee, H; Cho, D; Hwang, CS

authors

publication date

  • January 1, 2017

published in

publisher

  • American Chemical Society

start page

  • 41387

end page

  • 41396

volume

  • 9

issue

  • 47