Simultaneous mapping of nanoscale topography and surface potential of charged surfaces by scanning ion conductance microscopy Article

Chen, Feng, Panday, Namuna, Li, Xiaoshuang et al. (2020). Simultaneous mapping of nanoscale topography and surface potential of charged surfaces by scanning ion conductance microscopy . NANOSCALE, 12(40), 20737-20748. 10.1039/d0nr04555a

International Collaboration

cited authors

  • Chen, Feng; Panday, Namuna; Li, Xiaoshuang; Ma, Tao; Guo, Jing; Wang, Xuewen; Kos, Lidia; Hu, Ke; Gu, Ning; He, Jin

authors

publication date

  • October 28, 2020

published in

keywords

  • ATOMIC-FORCE MICROSCOPY
  • CELLS
  • Chemistry
  • Chemistry, Multidisciplinary
  • DYNAMICS
  • Materials Science
  • Materials Science, Multidisciplinary
  • Nanoscience & Nanotechnology
  • PROBES
  • Physical Sciences
  • Physics
  • Physics, Applied
  • SPEED
  • Science & Technology
  • Science & Technology - Other Topics
  • TRANSPORT
  • Technology

Digital Object Identifier (DOI)

publisher

  • ROYAL SOC CHEMISTRY

start page

  • 20737

end page

  • 20748

volume

  • 12

issue

  • 40