The application of artificial neural network to defect characterization in eddy current NDT Conference

KOH, CS, MOHAMMED, OA, JUNG, HK et al. (1995). The application of artificial neural network to defect characterization in eddy current NDT . 6 161-164.

cited authors

  • KOH, CS; MOHAMMED, OA; JUNG, HK; HAHN, SY

authors

date/time interval

  • June 22, 1994 -

publication date

  • January 1, 1995

webpage

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology

Location

  • SEOUL, SOUTH KOREA

International Standard Book Number (ISBN) 10

Conference

  • International ISEM Symposium on Advanced Computational and Design Techniques in Applied Electromagnetic Systems (ISEM-Seoul)

publisher

  • ELSEVIER SCIENCE PUBL B V

start page

  • 161

end page

  • 164

volume

  • 6