AI Powered THz VLSI Testing Technology Conference

Akter, Naznin, Karabiyik, Mustafa, Shur, Michael et al. (2020). AI Powered THz VLSI Testing Technology . 2020 IEEE 29TH NORTH ATLANTIC TEST WORKSHOP (NATW), 10.1109/natw49237.2020.9153077

cited authors

  • Akter, Naznin; Karabiyik, Mustafa; Shur, Michael; Suarez, John; Pala, Nezih

sustainable development goals

authors

date/time interval

  • June 17, 2020 -

publication date

  • January 1, 2020

published in

keywords

  • COUNTERFEIT INTEGRATED-CIRCUITS
  • Computer Science
  • Computer Science, Theory & Methods
  • Engineering
  • Engineering, Electrical & Electronic
  • Science & Technology
  • Technology
  • Terahertz
  • artificial intelligence
  • authentication
  • hardware cybersecurity
  • reliability

Location

  • ELECTR NETWORK

Digital Object Identifier (DOI)

Conference

  • IEEE 29th North Atlantic Test Workshop (NATW)

publisher

  • IEEE