Effect of ambient pressure on resistance and resistance fluctuations in single-wall carbon nanotube devices Article

Vijayaraghavan, A, Kar, S, Rumyantsev, S et al. (2006). Effect of ambient pressure on resistance and resistance fluctuations in single-wall carbon nanotube devices . JOURNAL OF APPLIED PHYSICS, 100(2), 10.1063/1.2218265

Industry Collaboration International Collaboration

cited authors

  • Vijayaraghavan, A; Kar, S; Rumyantsev, S; Khanna, A; Soldano, C; Pala, N; Vajtai, R; Kanzaki, K; Kobayashi, Y; Nalamasu, O; Shur, MS; Ajayan, PM

authors

publication date

  • July 15, 2006

webpage

published in

keywords

  • 1/F NOISE
  • ELECTRONIC-PROPERTIES
  • LOW-FREQUENCY NOISE
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • TRANSPORT

Digital Object Identifier (DOI)

publisher

  • AMER INST PHYSICS

volume

  • 100

issue

  • 2